SAE J1211 PDF

There was a high level of concern that the harsh environmental conditions experienced in locations in the vehicle could have a serious negative affect on the reliability of electronic components and systems. The focus of the version of SAE J was on characterizing these harsh vehicle environment for areas of the vehicle engine compartment, instrument panel, passenger compartment, truck, under body, etc. By testing their prototypes at the worst case conditions i. The sample size for these tests was determined using binomial distribution statistical tables and this would result in a requirement to test 6 to 24 test units without experiencing a failure. If a failure occurred, the sample size would have to be increased and the testing continued without another failure till the "bogie" was reached.

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There was a high level of concern that the harsh environmental conditions experienced in locations in the vehicle could have a serious negative affect on the reliability of electronic components and systems. The focus of the version of J was on characterizing these harsh vehicle environment for areas of the vehicle engine compartment, instrument panel, passenger compartment, truck, under body, etc.

By testing their prototypes at the worst case conditions i. The sample size for these tests was determined using binomial distribution statistical tables and this would result in a requirement to test 6 to 24 test units without experiencing a failure. The environmental conditions during the test were typically defined such that the units under test were operated at specification limits based on J recommended practices e.

By the turn of the century automobile warranty periods had increased from 12 months to 3, 4, 5 and even 10 years for some systems and most manufacturers had started specifying life expectancies for vehicle components of 10, 15 and sometimes 20 years.

This translates to failure rates in the 0. The achievement of such high reliability is not the result of test-to-pass reliability demonstration testing based on binomial distribution statistical tables.

With this method, reliability demonstration in the On the contrary, the methods and techniques used by engineering teams achieving such reliability excellence did not require increasingly large sample sizes, more expensive and lengthy testing, or more engineers.

The task force leaders and members were of the strong opinion that the version of SAE J should document the state-of-the-art methods and techniques being used by leading companies and engineering teams to achieve ultra-high reliability while at the same time reducing overall cost life-cycle and shortening time-to-market.

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Where practical, methods of extrinsic reliability detection and prevention will also be addressed. EEM qualification is the main scope of this document. Other procedures addressing random failures are specifically addressed in the CPI Component Process Interaction section This document is to be used within the context of the Zero Defect concept for component manufacturing and product use. The emphasis of this document is on hardware and manufacturing failure mechanisms, however, other contemporary issues as shown in Figure 1 need to be addressed for a thorough Robustness Validation. A Pareto of contemporary issues is shown in Figure 1.

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